Elemental Analysis by EDXRF

Applied Rigaku Technologies specializes in EDXRF (energy dispersive X-ray fluorescence) instrumentation and offers benchtop and process control systems for analyzing solids, liquids, powders, coatings, and thin films.

Elemental analysis by EDXRF allows you to measure and monitor elements in almost any sample type. Whether you are improving the quality of products or optimizing industrial processes, we understand getting quick, high-quality results while also managing costs is critical.

You can measure a wide range of atomic elements with detection limits from low ppm to high weight percent. EDXRF may also be used to measure the thickness and composition of coatings and multi-layer thin films.

our Products

RIGAKU NEX QC

Measurement of all elements from sodium (Na) to uranium (U)
Multi-element capabilities, from ppm to percent levels
Multi-application versatility, including solids, liquids, alloys, powders, and thin films
50 kV X-ray tube for wide elemental coverage
High-performance semiconductor detector
Multiple automated tube filters for enhanced sensitivity

NEX QC+ QuantEZ

Measurement of all elements from sodium (Na) to uranium (U)
Multi-element capabilities, from ppm to percent levels
Multi-application versatility, including solids, liquids, alloys, powders, and thin films
50 kV X-ray tube for wide elemental coverage
High-performance semiconductor detector
Multiple automated tube filters for enhanced sensitivity

NEX CG II Series

NEX CG II Series are powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometers that deliver rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types—from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
Non-destructive elemental analysis for sodium (Na) to uranium (U)
Quick elemental analyses of solids, liquids, powders, coatings, and thin films

NEX DE Series

Measurement of all elements from sodium (Na) to uranium (U) from ppm to percent level
Multi-application versatility, including solids, liquids, alloys, powders, and thin films
60 kV X-ray tube for wide elemental coverage
High-performance SDD for superior data
Small spot analysis, 1 mm, 3 mm, and 10 mm